• phys.org | 7/24/2017 | Staff
    When it comes to extremely fine, precise features, a scanning electron microscope (SEM) is unrivaled. A focused electron beam can directly deposit complex features onto a substrate in a single step...
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  • phys.org | 7/25/2017 | Staff
    While the charge and spin properties of electrons are widely utilized in modern day technologies such as transistors and memories, another aspect of the subatomic particle has long remained...
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